Description

Several decades of transistor technology scaling has brought the threat of soft errors to modern embedded processors. Several techniques have been proposed to protect these systems from soft errors. However,

Several decades of transistor technology scaling has brought the threat of soft errors to modern embedded processors. Several techniques have been proposed to protect these systems from soft errors. However, their effectiveness in protecting the computation cannot be ascertained without accurate and quantitative estimation of system reliability. Vulnerability -- a metric that defines the probability of system-failure (reliability) through analytical models -- is the most effective mechanism for our current estimation and early design space exploration needs.

Reuse Permissions
  • 1.08 MB application/pdf

    Download count: 0

    Details

    Contributors
    Date Created
    • 2016
    Resource Type
  • Text
  • Collections this item is in
    Note
    • Partial requirement for: M.S., Arizona State University, 2016
      Note type
      thesis
    • Includes bibliographical references (pages 28-30)
      Note type
      bibliography
    • Field of study: Computer science

    Citation and reuse

    Statement of Responsibility

    by Srinivas Karthik Tanikella

    Machine-readable links