Description
Multifunctional oxide thin-films grown on silicon and several oxide substrates have been characterized using High Resolution (Scanning) Transmission Electron Microscopy (HRTEM), Energy-Dispersive X-ray Spectroscopy (EDX), and Electron Energy-Loss Spectroscopy (EELS). Oxide thin films grown on SrTiO3/Si pseudo-substrate showed the presence of amorphised SrTiO3 (STO) at the STO/Si interface.
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Contributors
- Dhamdhere, Ajit (Author)
- Smith, David J. (Thesis advisor)
- McCartney, Martha R. (Committee member)
- Chamberlin, Ralph (Committee member)
- Ponce, Fernando (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2015
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- Partial requirement for: Ph.D., Arizona State University, 2015Note typethesis
- Includes bibliographical referencesNote typebibliography
- Field of study: Physics
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by Ajit Dhamdhere