Description
Microwave (MW), thermal, and ultraviolet (UV) annealing were used to explore the response of Ag structures on a Ge-Se chalcogenide glass (ChG) thin film as flexible radiation sensors, and Te-Ti chalcogenide thin films as a material for diffusion barriers in microelectronics devices and processing of metallized Cu.
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Contributors
- Roos, Benjamin, 1990- (Author)
- Alford, Terry L. (Thesis advisor)
- Theodore, David (Committee member)
- Kozicki, Michael (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2013
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Note
- Vita
- Partial requirement for: M.S., Arizona State University, 2013Note typethesis
- Includes bibliographical references (p. 40-42)Note typebibliography
- Field of study: Materials science and engineering
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by Benjamin Roos