Description
Microwave (MW), thermal, and ultraviolet (UV) annealing were used to explore the response of Ag structures on a Ge-Se chalcogenide glass (ChG) thin film as flexible radiation sensors, and Te-Ti chalcogenide thin films as a material for diffusion barriers in microelectronics devices and processing of metallized Cu.
Download count: 0
Details
Contributors
- Roos, Benjamin, 1990- (Author)
- Alford, Terry L. (Thesis advisor)
- Theodore, David (Committee member)
- Kozicki, Michael (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2013
Subjects
Resource Type
Collections this item is in
Note
- Vita
- Partial requirement for: M.S., Arizona State University, 2013Note typethesis
- Includes bibliographical references (p. 40-42)Note typebibliography
- Field of study: Materials science and engineering
Citation and reuse
Statement of Responsibility
by Benjamin Roos