Mass spectrometric analysis requires that atoms from the sample be ionized in the gas phase. Secondary ion mass spectrometry achieves this by sputtering samples with an energetic primary ion beam. Several investigations of the sputtering and ionization process have been conducted.
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- Partial requirement for: Ph.D., Arizona State University, 2012Note typethesis
- Includes bibliographical referencesNote typebibliography
- Field of study: Chemistry