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Built-in-Self-Test (BiST) for transmitters is a desirable choice since it eliminates the reliance on expensive instrumentation to do RF signal analysis. Existing on-chip resources, such as power or envelope detectors,

Built-in-Self-Test (BiST) for transmitters is a desirable choice since it eliminates the reliance on expensive instrumentation to do RF signal analysis. Existing on-chip resources, such as power or envelope detectors, or small additional circuitry can be used for BiST purposes. However, due to limited bandwidth, measurement of complex specifications, such as IQ imbalance, is challenging. In this work, a BiST technique to compute transmitter IQ imbalances using measurements out of a self-mixing envelope detector is proposed.

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    Date Created
    • 2012
    Resource Type
  • Text
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    Note
    • Partial requirement for: M.S., Arizona State University, 2012
      Note type
      thesis
    • Includes bibliographical references (p. 44-46)
      Note type
      bibliography
    • Field of study: Electrical engineering

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    by Srinath Byregowda

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