Description
Pb-free solder joints are commonly used as interconnects in semiconductor packaging. One of the major defects affecting the mechanical performance of solder joints are reflow pores that form during processing. These pores exhibit significant variability in size and distribution, and understanding the effects of pore geometry on failure is an important reliability concern.
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Contributors
- Padilla, Erick (Author)
- Chawla, Nikhilesh (Thesis advisor)
- Alford, Terry (Committee member)
- Krause, Stephen (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2012
Subjects
Resource Type
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Note
- Partial requirement for: M.S., Arizona State University, 2012Note typethesis
- Includes bibliographical references (p. 59-63)Note typebibliography
- Field of study: Materials science and engineering
Citation and reuse
Statement of Responsibility
by Eric Padilla