Description

The research described in this dissertation has involved the use of transmission electron microcopy (TEM) to characterize the structural properties of II-VI and III-V compound semiconductor heterostructures and superlattices.

Reuse Permissions
  • Downloads
    pdf (20.3 MB)

    Download count: 0

    Details

    Contributors
    Date Created
    2012
    Resource Type
  • Text
  • Collections this item is in
    Note
    • Partial requirement for: Ph.D., Arizona State University, 2012
      Note type
      thesis
    • Includes bibliographical references
      Note type
      bibliography
    • Field of study: Physics

    Citation and reuse

    Statement of Responsibility

    by Lu Ouyang

    Machine-readable links