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Reducing device dimensions, increasing transistor densities, and smaller timing windows, expose the vulnerability of processors to soft errors induced by charge carrying particles. Since these factors are inevitable in the advancement of processor technology, the industry has been forced to improve reliability on general purpose Chip Multiprocessors (CMPs).

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    Date Created
    2011
    Resource Type
  • Text
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    Note
    • Partial requirement for: M.S., Arizona State University, 2011
      Note type
      thesis
    • Includes bibliographical references (p. 31-32)
      Note type
      bibliography
    • Field of study: Computer science

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    by Fei Hong

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