Description
Reducing device dimensions, increasing transistor densities, and smaller timing windows, expose the vulnerability of processors to soft errors induced by charge carrying particles. Since these factors are inevitable in the advancement of processor technology, the industry has been forced to improve reliability on general purpose Chip Multiprocessors (CMPs).
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Contributors
- Hong, Fei (Author)
- Shrivastava, Aviral (Thesis advisor)
- Bazzi, Rida (Committee member)
- Fainekos, Georgios (Committee member)
- Arizona State University (Publisher)
Date Created
The date the item was original created (prior to any relationship with the ASU Digital Repositories.)
2011
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Note
- Partial requirement for: M.S., Arizona State University, 2011Note typethesis
- Includes bibliographical references (p. 31-32)Note typebibliography
- Field of study: Computer science
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by Fei Hong