Reducing device dimensions, increasing transistor densities, and smaller timing windows, expose the vulnerability of processors to soft errors induced by charge carrying particles. Since these factors are inevitable in the advancement of processor technology, the industry has been forced to improve reliability on general purpose Chip Multiprocessors (CMPs). With the availability of increased hardware resources, redundancy based techniques are the most promising methods to eradicate soft error failures in CMP systems.
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- Partial requirement for: M.S., Arizona State University, 2011Note typethesis
- Includes bibliographical references (p. 31-32)Note typebibliography
- Field of study: Computer science