Description

Reducing device dimensions, increasing transistor densities, and smaller timing windows, expose the vulnerability of processors to soft errors induced by charge carrying particles. Since these factors are inevitable in the

Reducing device dimensions, increasing transistor densities, and smaller timing windows, expose the vulnerability of processors to soft errors induced by charge carrying particles. Since these factors are inevitable in the advancement of processor technology, the industry has been forced to improve reliability on general purpose Chip Multiprocessors (CMPs). With the availability of increased hardware resources, redundancy based techniques are the most promising methods to eradicate soft error failures in CMP systems.

Reuse Permissions
  • 385.82 KB application/pdf

    Download count: 0

    Details

    Contributors
    Date Created
    • 2011
    Resource Type
  • Text
  • Collections this item is in
    Note
    • Partial requirement for: M.S., Arizona State University, 2011
      Note type
      thesis
    • Includes bibliographical references (p. 31-32)
      Note type
      bibliography
    • Field of study: Computer science

    Citation and reuse

    Statement of Responsibility

    by Fei Hong

    Machine-readable links