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To test reproducibility of a technical specification under development for potential-induced degradation (PID) and polarization, three crystalline silicon module types were distributed in five replicas each to five laboratories. Stress

To test reproducibility of a technical specification under development for potential-induced degradation (PID) and polarization, three crystalline silicon module types were distributed in five replicas each to five laboratories. Stress tests were performed in environmental chambers at 60 °C, 85% relative humidity, 96 h, and with module nameplate system voltage applied.

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  • 2015-01-01
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    Hacke, Peter, Terwilliger, Kent, Glick, Stephen, Tamizhmani, Govindasamy, Tatapudi, Sai, Stark, Cameron, Koch, Simon, Weber, Thomas, Berghold, Juliane, Hoffmann, Stephan, Koehl, Michael, Dietrich, Sascha, Ebert, Matthias, & Mathiak, Gerhard (2015). Interlaboratory Study to Determine Repeatability of the Damp-Heat Test Method for Potential-Induced Degradation and Polarization in Crystalline Silicon Photovoltaic Modules. IEEE JOURNAL OF PHOTOVOLTAICS, 5(1), 94-101. http://dx.doi.org/10.1109/JPHOTOV.2014.2361650

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