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Reversible and reproducible formation and dissolution of silver conductive filaments are studied in Ag-photodoped thin-film Ge40S60 subjected to electric fields. A tip-planar geometry is employed, where a conductive-atomic-force microscopy ti

Reversible and reproducible formation and dissolution of silver conductive filaments are studied in Ag-photodoped thin-film Ge40S60 subjected to electric fields. A tip-planar geometry is employed, where a conductive-atomic-force microscopy tip is the tip electrode and a silver patch is the planar electrode. We highlight an inherent "memory" effect in the amorphous chalcogenide solid-state electrolyte, in which particular silver-ion migration pathways are preserved "memorized" during writing and erasing cycles.

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    Date Created
    • 2015-07-01
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  • Text
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    • Digital object identifier: 10.1063/1.4927006
    • Identifier Type
      International standard serial number
      Identifier Value
      2158-3226
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    • Copyright 2015 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. along with the following message: The following article appeared in AIP ADVANCES 5, 7 (2015) and may be found at http://dx.doi.org/10.1063/1.4927006, opens in a new window

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    Orava, J., Kozicki, M. N., Yannopoulos, S. N., & Greer, A. L. (2015). Reversible migration of silver on memorized pathways in Ag-Ge40S60 films. AIP ADVANCES, 5(7). http://dx.doi.org/10.1063/1.4927006

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