Description

We used a novel diffraction-based method to extract the local, atomic-level elastic strain in nanoscale amorphous TiAl films during in situ transmission electron microscopy deformation, while simultaneously measuring the macroscopic

We used a novel diffraction-based method to extract the local, atomic-level elastic strain in nanoscale amorphous TiAl films during in situ transmission electron microscopy deformation, while simultaneously measuring the macroscopic strain. The complementary strain measurements revealed significant anelastic deformation, which was independently confirmed by strain rate experiments.

Reuse Permissions
  • application/pdf

    Download count: 0

    Details

    Contributors
    Date Created
    • 2016-09-22
    Resource Type
  • Text
  • Collections this item is in
    Identifier
    Note

    Citation and reuse

    Cite this item

    This is a suggested citation. Consult the appropriate style guide for specific citation guidelines.

    Sarkar, R., Ebner, C., Izadi, E., Rentenberger, C., & Rajagopalan, J. (2016). Revealing anelasticity and structural rearrangements in nanoscale metallic glass films usingin situTEM diffraction. Materials Research Letters, 1-9. doi:10.1080/21663831.2016.1228709

    Machine-readable links